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в PONS речника

немски

английски

Ras·ter(·elek·tro·nen)·mi·kro·skop СЪЩ ср

Raster(elektronen)mikroskop: scanning electron microscope

Raster(elektronen)mikroskop: SEM

английски

немски

scanning electron microscope: Rasterelektronenmikroskop ср <-s, -e>

"Биология"

scanning electron microscope (SEM): Rasterelektronenmikroskop (REM)

PONS OpenDict

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Изпрати ни ново предложение за PONS OpenDict. Предложенията се преглеждат от редакционния екип на PONS и след това се включват в PONS OpenDict.

Добави предложение

Примери от интернет (не са проверени от PONS редакцията)

[...]

Bei einem Rasterelektronenmikroskop wird ein Elektronenstrahl über die zu untersuchende Probenoberfläche geführt ( Rasterung ).

[...]

chemie.uni-paderborn.de

[...]

In a scanning electron microscope an electron beam is scanned over the surface of a sample ( scanning ).

[...]

chemie.uni-paderborn.de

[...]

Das XL 40 von Philips ist ein Rasterelektronenmikroskop mit extra großer Probenkammer.

[...]

www.mv.uni-kl.de

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The XL 40 manufactured by Philips is a scanning electron microscope with an extra large sample chamber.

[...]

www.mv.uni-kl.de

[...]

Für die Analyse von prozessierten Schichten und Strukturen stehen neben Lichtmikroskopen auch ein Rasterelektronenmikroskop (JEOL) und ein Rasterkraftmikroskop (DME) zur Verfügung.

www.igm.uni-stuttgart.de

[...]

There are several optical microscopes available to analyse the processed layers and structures, as well as a scanning electron microscope (JEOL) and an atomic force microscope (DME).

www.igm.uni-stuttgart.de

[...]

Seit 15 Jahren werden den meisten Erstbeschreibungen Fotos des Samens beigefügt, die unter dem Rasterelektronenmikroskop gemacht wurden - oft als REM-Aufnahmen abgekürzt.

[...]

www.internoto.de

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For 15 years most first descriptions have included photos of the seed, which were made under the scanning electron microscope - often abbreviated to SEM ( REM in German ).

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www.internoto.de

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Focused Ion Beam mit Rasterelektronenmikroskop und angeschlossenem EDX (Zeiss Neon 40) Sputteranlage zur Probenvorbereitung:

chemie.uni-paderborn.de

[...]

Focused Ion Beam with Scanning Electron Microscope and EDX (Zeiss Neon 40) Sputtercoating sample preparation:

chemie.uni-paderborn.de